A random-walk benchmark for single-electron circuits

por Reifert, David, Kokainis, Martins, Ambainis, Andris, Kashcheyevs, Vyacheslavs, Ubbelohde, Niels
Publicado 2021

Measurement of finite-frequency current statistics in a single-electron transistor

por Ubbelohde, Niels, Fricke, Christian, Flindt, Christian, Hohls, Frank, Haug, Rolf J.
Publicado 2012