Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction

por Mikhalychev, Alexander, Benediktovitch, Andrei, Ulyanenkova, Tatjana, Ulyanenkov, Alex
Publicado 2015

Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction

por Benediktovitch, Andrei, Zhylik, Alexei, Ulyanenkova, Tatjana, Myronov, Maksym, Ulyanenkov, Alex
Publicado 2015

Characterization of SiGe thin films using a laboratory X-ray instrument

por Ulyanenkova, Tatjana, Myronov, Maksym, Benediktovitch, Andrei, Mikhalychev, Alexander, Halpin, John, Ulyanenkov, Alex
Publicado 2013