Damage evaluation in graphene underlying atomic layer deposition dielectrics

por Tang, Xiaohui, Reckinger, Nicolas, Poncelet, Olivier, Louette, Pierre, Ureña, Ferran, Idrissi, Hosni, Turner, Stuart, Cabosart, Damien, Colomer, Jean-François, Raskin, Jean-Pierre, Hackens, Benoit, Francis, Laurent A.
Publicado 2015