ToF-SIMS 3D Analysis of Thin Films Deposited in High Aspect Ratio Structures via Atomic Layer Deposition and Chemical Vapor Deposition

por Kia, Alireza M., Haufe, Nora, Esmaeili, Sajjad, Mart, Clemens, Utriainen, Mikko, Puurunen, Riikka L., Weinreich, Wenke
Publicado 2019

Evaluation of MEMS NIR Spectrometers for On-Farm Analysis of Raw Milk Composition

por Uusitalo, Sanna, Diaz-Olivares, José, Sumen, Juha, Hietala, Eero, Adriaens, Ines, Saeys, Wouter, Utriainen, Mikko, Frondelius, Lilli, Pastell, Matti, Aernouts, Ben
Publicado 2021