Non-equidistant scanning approach for millimetre-sized SPM measurements

por Klapetek, Petr, Valtr, Miroslav, Buršík, Petr
Publicado 2012

How levelling and scan line corrections ruin roughness measurement and how to prevent it

por Nečas, David, Valtr, Miroslav, Klapetek, Petr
Publicado 2020

Atomic force microscopy analysis of nanoparticles in non-ideal conditions

por Klapetek, Petr, Valtr, Miroslav, Nečas, David, Salyk, Ota, Dzik, Petr
Publicado 2011

Scanning Probe Microscopy controller with advanced sampling support

por Valtr, Miroslav, Klapetek, Petr, Martinek, Jan, Novotný, Ondřej, Jelínek, Zdeněk, Hortvík, Václav, Nečas, David
Publicado 2023

Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

por Lazar, Josef, Klapetek, Petr, Valtr, Miroslav, Hrabina, Jan, Buchta, Zdenek, Cip, Onrej, Cizek, Martin, Oulehla, Jindrich, Sery, Mojmir
Publicado 2014