Through Silicon Via Redistribution of I/O Pads

por Seller, P, Bell, S, Wilson, M D, Veale, M C
Publicado 2012

Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging

por Golovin, G., Banerjee, S., Liu, C., Chen, S., Zhang, J., Zhao, B., Zhang, P., Veale, M., Wilson, M., Seller, P., Umstadter, D.
Publicado 2016

Mapping of multi-elements during melting and solidification using synchrotron X-rays and pixel-based spectroscopy

por Liotti, E., Lui, A., Connolley, T., Dolbnya, I.P., Sawhney, K.J.S., Malandain, A., Wilson, M.D., Veale, M.C., Seller, P., Grant, P.S.
Publicado 2015

3D chemical imaging in the laboratory by hyperspectral X-ray computed tomography

por Egan, C. K., Jacques, S. D. M., Wilson, M. D., Veale, M. C., Seller, P., Beale, A. M., Pattrick, R. A. D., Withers, P. J., Cernik, R. J.
Publicado 2015

Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

por Rakowski, R., Golovin, G., O’Neal, J., Zhang, J., Zhang, P., Zhao, B., Wilson, M. D., Veale, M. C., Seller, P., Chen, S., Banerjee, S., Umstadter, D., Fuchs, M.
Publicado 2017