Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns: a numerical study

por Dupraz, Maxime, Beutier, Guillaume, Rodney, David, Mordehai, Dan, Verdier, Marc
Publicado 2015

Scanning force microscope for in situ nanofocused X-ray diffraction studies

por Ren, Zhe, Mastropietro, Francesca, Davydok, Anton, Langlais, Simon, Richard, Marie-Ingrid, Furter, Jean-Jacques, Thomas, Olivier, Dupraz, Maxime, Verdier, Marc, Beutier, Guillaume, Boesecke, Peter, Cornelius, Thomas W.
Publicado 2014