Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging

por Carasso, Alfred S, Vladár, András E
Publicado 2014

Fractional Diffusion, Low Exponent Lévy Stable Laws, and ‘Slow Motion’ Denoising of Helium Ion Microscope Nanoscale Imagery

por Carasso, Alfred S., Vladár, András E.
Publicado 2012

Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype

por Postek, Michael T., Vladar, Andras E., Jones, Samuel N., Keery, William J.
Publicado 1993

X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement

por Postek, Michael T., Lowney, Jeremiah R., Vladar, Andras E., Keery, William J., Marx, Egon, Larrabee, Robert D.
Publicado 1993