Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

por Beyer, Hannes, Wagner, Tino, Stemmer, Andreas
Publicado 2016

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

por Ritz, Christian, Wagner, Tino, Stemmer, Andreas
Publicado 2020

Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire

por Wagner, Tino, Menges, Fabian, Riel, Heike, Gotsmann, Bernd, Stemmer, Andreas
Publicado 2018

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

por Wagner, Tino, Beyer, Hannes, Reissner, Patrick, Mensch, Philipp, Riel, Heike, Gotsmann, Bernd, Stemmer, Andreas
Publicado 2015