Reliability of Miniaturized Transistors from the Perspective of Single-Defects

por Waltl, Michael
Publicado 2020

Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors

por Stampfer, Bernhard, Schanovsky, Franz, Grasser, Tibor, Waltl, Michael
Publicado 2020

Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si(3)N(4))

por Wilhelmer, Christoph, Waldhoer, Dominic, Cvitkovich, Lukas, Milardovich, Diego, Waltl, Michael, Grasser, Tibor
Publicado 2023

Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning

por Knobloch, Theresia, Uzlu, Burkay, Illarionov, Yury Yu., Wang, Zhenxing, Otto, Martin, Filipovic, Lado, Waltl, Michael, Neumaier, Daniel, Lemme, Max C., Grasser, Tibor
Publicado 2022