Optical Constants and Band Gap Evolution with Phase Transition in Sub-20-nm-Thick TiO(2) Films Prepared by ALD

por Shi, Yue-Jie, Zhang, Rong-Jun, Zheng, Hua, Li, Da-Hai, Wei, Wei, Chen, Xin, Sun, Yan, Wei, Yan-Feng, Lu, Hong-Liang, Dai, Ning, Chen, Liang-Yao
Publicado 2017

The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition

por Wang, Zi-Yi, Zhang, Rong-Jun, Lu, Hong-Liang, Chen, Xin, Sun, Yan, Zhang, Yun, Wei, Yan-Feng, Xu, Ji-Ping, Wang, Song-You, Zheng, Yu-Xiang, Chen, Liang-Yao
Publicado 2015