Editorial for the Special Issue on Advanced Machine Learning Techniques for Sensing and Imaging Applications

por Wen, Bihan, Wang, Zhangyang
Publicado 2022

Towards More Efficient Security Inspection via Deep Learning: A Task-Driven X-ray Image Cropping Scheme

por Nguyen, Hong Duc, Cai, Rizhao, Zhao, Heng, Kot, Alex C., Wen, Bihan
Publicado 2022

Rare bioparticle detection via deep metric learning

por Luo, Shaobo, Shi, Yuzhi, Chin, Lip Ket, Zhang, Yi, Wen, Bihan, Sun, Ying, Nguyen, Binh T. T., Chierchia, Giovanni, Talbot, Hugues, Bourouina, Tarik, Jiang, Xudong, Liu, Ai-Qun
Publicado 2021