Potential Screening at Electrode/Ionic Liquid Interfaces from In Situ X‐ray Photoelectron Spectroscopy

por Greco, Francesco, Shin, Sunghwan, Williams, Federico J., Heller, Bettina S. J., Maier, Florian, Steinrück, Hans‐Peter
Publicado 2019

Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy

por Kataev, Elmar, Wechsler, Daniel, Williams, Federico J., Köbl, Julia, Tsud, Natalia, Franchi, Stefano, Steinrück, Hans‐Peter, Lytken, Ole
Publicado 2020