Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

por Zhou, Yangbo, Fox, Daniel S, Maguire, Pierce, O’Connell, Robert, Masters, Robert, Rodenburg, Cornelia, Wu, Hanchun, Dapor, Maurizio, Chen, Ying, Zhang, Hongzhou
Publicado 2016

Discovering the forbidden Raman modes at the edges of layered materials

por Guo, Yao, Zhang, Weixuan, Wu, Hanchun, Han, Junfeng, Zhang, Yongliang, Lin, Shenghuang, Liu, Chunru, Xu, Kang, Qiao, Jingsi, Ji, Wei, Chen, Qing, Gao, Song, Zhang, Wenjing, Zhang, Xiangdong, Chai, Yang
Publicado 2018