Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method †

por Chao, Calvin Yi-Ping, Tu, Honyih, Wu, Thomas Meng-Hsiu, Chou, Kuo-Yu, Yeh, Shang-Fu, Yin, Chin, Lee, Chih-Lin
Publicado 2017

Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor †

por Chao, Calvin Yi-Ping, Wu, Thomas Meng-Hsiu, Yeh, Shang-Fu, Lee, Chih-Lin, Tu, Honyih, Huang, Joey Chiao-Yi, Chang, Chin-Hao
Publicado 2023