Improved Current Density and Contact Resistance in Bilayer MoSe(2) Field Effect Transistors by AlO(x) Capping

por Somvanshi, Divya, Ber, Emanuel, Bailey, Connor S., Pop, Eric, Yalon, Eilam
Publicado 2020

Spatially Resolved Thermometry of Resistive Memory Devices

por Yalon, Eilam, Deshmukh, Sanchit, Muñoz Rojo, Miguel, Lian, Feifei, Neumann, Christopher M., Xiong, Feng, Pop, Eric
Publicado 2017

Direct measurement of nanoscale filamentary hot spots in resistive memory devices

por Deshmukh, Sanchit, Rojo, Miguel Muñoz, Yalon, Eilam, Vaziri, Sam, Koroglu, Cagil, Islam, Raisul, Iglesias, Ricardo A., Saraswat, Krishna, Pop, Eric
Publicado 2022

Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopy

por Swoboda, Timm, Wainstein, Nicolás, Deshmukh, Sanchit, Köroğlu, Çağıl, Gao, Xing, Lanza, Mario, Hilgenkamp, Hans, Pop, Eric, Yalon, Eilam, Muñoz Rojo, Miguel
Publicado 2023

Ultrahigh thermal isolation across heterogeneously layered two-dimensional materials

por Vaziri, Sam, Yalon, Eilam, Muñoz Rojo, Miguel, Suryavanshi, Saurabh V., Zhang, Huairuo, McClellan, Connor J., Bailey, Connor S., Smithe, Kirby K. H., Gabourie, Alexander J., Chen, Victoria, Deshmukh, Sanchit, Bendersky, Leonid, Davydov, Albert V., Pop, Eric
Publicado 2019