Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs

por Langpoklakpam, Catherine, Liu, An-Chen, You, Neng-Jie, Kao, Ming-Hsuan, Huang, Wen-Hsien, Shen, Chang-Hong, Tzou, Jerry, Kuo, Hao-Chung, Shieh, Jia-Min
Publicado 2023