Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs

por Liu, Rui, Gao, Linchun, Wang, Juanjuan, Ni, Tao, Li, Yifan, Wang, Runjian, Li, Duoli, Bu, Jianhui, Zeng, Chuanbin, Li, Bo, Luo, Jiajun
Publicado 2023

Analysis of Degradation of Electromigration Reliability of Au-Al and OPM Wire Bonded Contacts at 250 °C Using Resistance Monitoring Method

por Li, Xueqin, Gao, Linchun, Ni, Tao, Zhou, Jingnan, Li, Xiaojing, Li, Yifan, Xu, Lida, Wang, Runjian, Zeng, Chuanbin, Li, Bo, Luo, Jiajun, Li, Jing
Publicado 2023

The Effect of Doping on the Digital Etching of Silicon-Selective Silicon–Germanium Using Nitric Acids

por Li, Yangyang, Zhu, Huilong, Kong, Zhenzhen, Zhang, Yongkui, Ai, Xuezheng, Wang, Guilei, Wang, Qi, Liu, Ziyi, Lu, Shunshun, Xie, Lu, Huang, Weixing, Liu, Yongbo, Li, Chen, Li, Junjie, Lin, Hongxiao, Su, Jiale, Zeng, Chuanbin, Radamson, Henry H.
Publicado 2021