ATNet: A Defect Detection Framework for X-ray Images of DIP Chip Lead Bonding

por Huang, Renbin, Zhan, Daohua, Yang, Xiuding, Zhou, Bei, Tang, Linjun, Cai, Nian, Wang, Han, Qiu, Baojun
Publicado 2023

A High-Precision Multi-Beam Optical Measurement Method for Cylindrical Surface Profile

por Zhou, Yinghong, Wu, Zhiliang, Cai, Nian, Zhan, Daohua, Xu, Shaoqiu, Chen, Meiyun, Zhou, Guang, Wang, Han
Publicado 2023

Convolutional Neural Network Defect Detection Algorithm for Wire Bonding X-ray Images

por Zhan, Daohua, Huang, Renbin, Yi, Kunran, Yang, Xiuding, Shi, Zhuohao, Lin, Ruinan, Lin, Jian, Wang, Han
Publicado 2023

Surface Quality Control Strategy of Aspherical Mold Based on Screw Feed Polishing of Small Polishing Tool

por Zhang, Jiarong, Wang, Han, Zhu, Xiangyou, Yao, Honghui, Zhuo, Shaomu, Ma, Shuaijie, Zhan, Daohua, Cai, Nian
Publicado 2022

Strip Surface Defect Detection Algorithm Based on YOLOv5

por Wang, Han, Yang, Xiuding, Zhou, Bei, Shi, Zhuohao, Zhan, Daohua, Huang, Renbin, Lin, Jian, Wu, Zhiheng, Long, Danfeng
Publicado 2023

A Lightweight Method for Detecting IC Wire Bonding Defects in X-ray Images

por Zhan, Daohua, Lin, Jian, Yang, Xiuding, Huang, Renbin, Yi, Kunran, Liu, Maoling, Zheng, Hehui, Xiong, Jingang, Cai, Nian, Wang, Han, Qiu, Baojun
Publicado 2023