Study of GaN coalescence by dark-field X-ray microscopy at the nanoscale

por Wehbe, Maya, Charles, Matthew, Baril, Kilian, Alloing, Blandine, Pino Munoz, Daniel, Labchir, Nabil, Zuniga-Perez, Jesús, Detlefs, Carsten, Yildirim, Can, Gergaud, Patrice
Publicado 2023

Displacement Talbot lithography for nano-engineering of III-nitride materials

por Coulon, Pierre-Marie, Damilano, Benjamin, Alloing, Blandine, Chausse, Pierre, Walde, Sebastian, Enslin, Johannes, Armstrong, Robert, Vézian, Stéphane, Hagedorn, Sylvia, Wernicke, Tim, Massies, Jean, Zúñiga‐Pérez, Jesus, Weyers, Markus, Kneissl, Michael, Shields, Philip A.
Publicado 2019