Expected resolution limits of x-ray free-electron laser single-particle imaging for realistic source and detector properties

por E, Juncheng, Kim, Y., Bielecki, J., Sikorski, M., de Wijn, R., Fortmann-Grote, C., Sztuk-Dambietz, J., Koliyadu, J. C. P., Letrun, R., Kirkwood, H. J., Sato, T., Bean, R., Mancuso, A. P., Kim, C.
Publicado 2022