Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity

por Doolette, Casey L., Howard, Daryl L., Afshar, Nader, Kewish, Cameron M., Paterson, David J., Huang, Jianyin, Wagner, Stefan, Santner, Jakob, Wenzel, Walter W., Raimondo, Tom, De Vries Van Leeuwen, Alexander T., Hou, Lei, van der Bom, Frederik, Weng, Han, Kopittke, Peter M., Lombi, Enzo
Publicado 2022