Applied logistic regression /

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, c2000.
Edition:2nd ed.
Series:Wiley series in probability and statistics. Texts and references section
Subjects:
Análisis de regresión
Online Access:Table of Contents

Internet

Table of Contents

Unidad de Servicios Bibliotecarios y de Información Xalapa -

Holdings details from Unidad de Servicios Bibliotecarios y de Información Xalapa -
Call Number: QA278.2 H67 2000
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