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| LEADER |
00000cam a22000002a 4500 |
| 001 |
ocm85783241 |
| 003 |
OCoLC |
| 005 |
20141204200946.0 |
| 008 |
091009s2007 nyua b 001 0 eng d |
| 010 |
|
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|a 2007007204
|
| 035 |
|
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|a (Sirsi) i9781600216350
|
| 040 |
|
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|a DLC
|c DLC
|d UV#
|
| 020 |
|
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|a 9781600216350
|
| 020 |
|
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|a 1600216358
|
| 050 |
|
4 |
|a QD96.S43
|b G72 2007
|
| 082 |
0 |
0 |
|a 543/.65
|2 22
|
| 100 |
1 |
|
|a Grams, Jacek.
|
| 245 |
1 |
0 |
|a New trends and potentialities of ToF-SIMS in surface studies /
|c Jacek Grams.
|
| 260 |
|
|
|a New York :
|b Nova Science Publishers,
|c c2007.
|
| 300 |
|
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|a 273 p. :
|b il. (algunas col.) ;
|c 27 cm.
|
| 504 |
|
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|a Incluye bibliografías e índice.
|
| 505 |
0 |
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|a Introduction -- ToF-SIMS basics and instrument development -- Biomaterials, biomolecules, biological systems and applications in medicine -- Polymers -- Investigations of other organic compounds -- Materials applied in electronic industry -- Environmental chemistry -- Inorganic surfaces -- Corrosion and monitoring of organic coating processes -- Forensic science -- Catalysis -- Investigations of surface contaminations -- Other applications.
|
| 650 |
|
4 |
|a Espectrometría de masas de iones
|x Investigación.
|
| 650 |
|
4 |
|a Tiempo de espectrometría de masas de vuelo
|x Investigación.
|
| 650 |
|
0 |
|a Secondary ion mass spectrometry
|x Research.
|
| 650 |
|
0 |
|a Time-of-flight mass spectrometry
|x Research.
|
| 901 |
|
|
|a Z0
|b UV#
|
| 902 |
|
|
|a DGBUV
|
| 596 |
|
|
|a 39
|
| 942 |
|
|
|c LIBRO
|
| 999 |
|
|
|c 228315
|d 228315
|
