|
|
|
|
| LEADER |
00000cam a22000002a 4500 |
| 001 |
ocm27938247 |
| 003 |
UV# |
| 005 |
20220824120403.0 |
| 008 |
100923r19971993ohua bf 001 0 eng d |
| 999 |
|
|
|c 235992
|d 235992
|
| 010 |
|
|
|a 93007792
|
| 020 |
|
|
|a 087170479X
|
| 020 |
|
|
|a 9780871704795
|
| 040 |
|
|
|a DLC
|b spa
|c DLC
|d UV#
|
| 050 |
|
4 |
|a TK7871
|b M52 1995
|
| 082 |
0 |
0 |
|a 621.381028/7
|2 20
|
| 245 |
0 |
0 |
|a Microelectronic failure analysis :
|b desk reference /
|c Thomas W. Lee, editor, Seshu V. Pabbisetty, editor.
|
| 250 |
|
|
|a 3rd ed.
|
| 260 |
|
|
|a Materials Park, OH :
|b ASM International,
|c c1995.
|
| 300 |
|
|
|a xv, 404 p. :
|b il. ;
|c 29 cm.
|
| 504 |
|
|
|a Incluye referencias bibliográficas e índice.
|
| 650 |
|
7 |
|a Electrónica
|x Aparatos e instrumentos
|v Manuales.
|9 359970
|
| 650 |
|
7 |
|a Microelectrónica
|x Materiales
|v Manuales.
|9 3804
|
| 650 |
|
4 |
|a Semiconductores
|9 361358
|v Manuales de laboratorio
|
| 700 |
1 |
|
|a Lee, Thomas W.,
|d editor.
|
| 700 |
1 |
|
|a Pabbisetty, Seshu V.,
|d editor.
|
| 901 |
|
|
|a Z0
|b UV#
|
| 942 |
|
|
|c LIBRO
|
