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System-level test and validation of hardware/software systems /
Otros Autores: | , , |
---|---|
Formato: | Libro |
Lenguaje: | English |
Publicado: |
London :
Springer,
c2010, 2010.
|
Colección: | Springer series in advanced microelectronics,
17 |
Materias: | |
Acceso en línea: | Información biográfica Tabla de contenido |
Tabla de Contenidos:
- Modeling permanent faults / J.P. Teixeira
- Test generation: a symbolic approach / F. Fummi and G. Pravadelli
- Test generation: a heuristic approach / O. Goloubeva, M. Sonza Reorda, and M. Violante
- Test generation: a hierarchical approach / G. Jervan ... [et al.]
- Test program generation from high-level microprocessor descriptions / E. Sánchez, M. Sonza Reorda, and G. Squillero
- Tackling concurrency and timing problems / I.G. Harris
- An approach to system-level design for test / G. Jervan ... [et al.]
- System-level dependability analysis / A. Bobbio ... [et al.].