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4 |
|a QH212.E4
|b E33 2016
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| 082 |
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4 |
|a 502.825
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| 100 |
1 |
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|a Egerton, R. F.
|9 448100
|e autor
|
| 245 |
1 |
0 |
|a Physical principles of electron microscopy :
|b an introduction to TEM, SEM, and AEM /
|c R.F. Egerton.
|
| 250 |
|
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|a Second Edition
|
| 264 |
|
1 |
|a Switzerland :
|b Springer,
|c [2016].
|
| 264 |
|
4 |
|c ©2016.
|
| 300 |
|
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|a xi, 196 páginas :
|b ilustraciones (algunas en color) ;
|c 24 cm.
|
| 336 |
|
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|a texto
|2 rdacontent
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| 337 |
|
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|a sin mediación
|2 rdamedia
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| 338 |
|
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|a volumen
|2 rdacarrier
|
| 504 |
|
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|a Incluye bibliografías e índice.
|
| 650 |
|
0 |
|a Microscopía electrónica
|9 448102
|
| 942 |
|
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|2 lcc
|c LIBRO
|
