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The Beetle Reference Manual: chip version 1.2

This paper details the electrical specifications, operating conditions and port definitions of the readout chip Beetle 1.2. The chip is developed for the LHCb experiment and fulfils the requirements of the silicon vertex detector (VELO, VETO), the silicon tracker and the RICH detector in case of mul...

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Detalles Bibliográficos
Autores principales: Baumeister, D, Löchner, S, Schmelling, M
Lenguaje:eng
Publicado: 2006
Materias:
Acceso en línea:http://cds.cern.ch/record/1000428
Descripción
Sumario:This paper details the electrical specifications, operating conditions and port definitions of the readout chip Beetle 1.2. The chip is developed for the LHCb experiment and fulfils the requirements of the silicon vertex detector (VELO, VETO), the silicon tracker and the RICH detector in case of multi-anode photomultiplier readout. It integrates 128 channels with low-noise charge-sensitive preamplifiers and shapers. The pulse shape can be chosen such that it complies with LHCb specifications: a peaking time of 25 ns with a remainder of the peak voltage after 25 ns of less than 30%. A comparator per channel with configurable polarity provides a binary signal. Four adjacent comparator channels are being ORed and brought off chip via LVDS ports. Either the shaper or comparator output is sampled with the LHC-bunch-crossing frequency of 40 MHz into an analog pipeline. This ring buffer has a programmable latency of max. 160 sampling intervals and an integrated derandomising buffer of 16 stages. For analog readout data is multiplexed with up to 40 MHz onto 1 or 4 ports. A binary readout mode operates at up to 80 MHz output rate on two ports. Current drivers bring the serialised data off chip. The chip can accept trigger rates of up to 1.1 MHz to perform a dead-timeless readout within 900 ns per trigger. For te stabi lity and calibration purposes, a charge injector with adjustable pulse height is implemented. The bias settings and various other parameters can be controlled via a standard I2C-interface. Appropriate design measures have been taken to ensure the radiation hardness against total ionising dose effects in excess of 10 Mrad. A robustness against Single Event Upset is achieved by redundant logic.