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6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices

Detalles Bibliográficos
Autores principales: Borchi, E, Bruzzi, M, Menichelli, D, Pace, E
Lenguaje:eng
Publicado: 2007
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/1001096
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author Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
author_facet Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
author_sort Borchi, E
collection CERN
id cern-1001096
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2007
record_format invenio
spelling cern-10010962021-07-30T13:17:51Zhttp://cds.cern.ch/record/1001096engBorchi, EBruzzi, MMenichelli, DPace, E6th International Conference on Radiation Effects on Semiconductor Materials Detectors and DevicesXXoai:cds.cern.ch:10010962007
spellingShingle XX
Borchi, E
Bruzzi, M
Menichelli, D
Pace, E
6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title 6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title_full 6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title_fullStr 6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title_full_unstemmed 6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title_short 6th International Conference on Radiation Effects on Semiconductor Materials Detectors and Devices
title_sort 6th international conference on radiation effects on semiconductor materials detectors and devices
topic XX
url http://cds.cern.ch/record/1001096
work_keys_str_mv AT borchie 6thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT bruzzim 6thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT menichellid 6thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices
AT pacee 6thinternationalconferenceonradiationeffectsonsemiconductormaterialsdetectorsanddevices