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Statistical analysis of reliability and life-testing models: theory and models

Detalles Bibliográficos
Autor principal: Bain, Lee J
Lenguaje:eng
Publicado: Dekker 1978
Materias:
Acceso en línea:http://cds.cern.ch/record/101149
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author Bain, Lee J
author_facet Bain, Lee J
author_sort Bain, Lee J
collection CERN
id cern-101149
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1978
publisher Dekker
record_format invenio
spelling cern-1011492021-04-22T06:13:23Zhttp://cds.cern.ch/record/101149engBain, Lee JStatistical analysis of reliability and life-testing models: theory and modelsMathematical Physics and MathematicsDekkeroai:cds.cern.ch:1011491978
spellingShingle Mathematical Physics and Mathematics
Bain, Lee J
Statistical analysis of reliability and life-testing models: theory and models
title Statistical analysis of reliability and life-testing models: theory and models
title_full Statistical analysis of reliability and life-testing models: theory and models
title_fullStr Statistical analysis of reliability and life-testing models: theory and models
title_full_unstemmed Statistical analysis of reliability and life-testing models: theory and models
title_short Statistical analysis of reliability and life-testing models: theory and models
title_sort statistical analysis of reliability and life-testing models: theory and models
topic Mathematical Physics and Mathematics
url http://cds.cern.ch/record/101149
work_keys_str_mv AT bainleej statisticalanalysisofreliabilityandlifetestingmodelstheoryandmodels