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Production accompanying testing of the ATLAS Pixel module

The ATLAS Pixel detector, innermost sub-detector of the ATLAS experiment at LHC, CERN, can be sensibly tested in its entirety the first time after its installation in 2006. Because of the poor accessibility (probably once per year) of the Pixel detector and tight scheduling the replacement of damage...

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Detalles Bibliográficos
Autor principal: Dobos, Daniel Adam
Lenguaje:eng
Publicado: Dortmund U. 2004
Materias:
Acceso en línea:http://cds.cern.ch/record/1016933
Descripción
Sumario:The ATLAS Pixel detector, innermost sub-detector of the ATLAS experiment at LHC, CERN, can be sensibly tested in its entirety the first time after its installation in 2006. Because of the poor accessibility (probably once per year) of the Pixel detector and tight scheduling the replacement of damaged modules after integration as well as during operation will become a highly exposed business. Therefore and to ensure that no affected parts will be used in following production steps, it is necessary that each production step is accompanied by testing the components before assembly and make sure the operativeness afterwards. Probably 300 of about total 2000 semiconductor hybrid pixel detector modules will be build at the Universität Dortmund. Thus a production test setup has been build up and examined before starting serial production. These tests contain the characterization and inspection of the module components and the module itself under different environmental conditions and diverse operating parameters. Once a module is assembled the operativeness is tested with a radioactive source and the long-time stability is assured by a burn-in. A fully electrical characterization is the basis for module selection and sorting for the ATLAS Pixel detector. Additionally the charge collection behavior of irradiated and non irradiated modules has been investigated in the H8 beamline with 180 GeV pions.