Performance of CMS ECAL Very Front End Electronics

We report the results of tests of 12880 Very Front End (VFE) readout cards for the barrel of the CMS electromagnetic calorimeter. A thorough test sequence was applied to each card including power-on test, burn-in and final calibration. Cards failing the tests were at the few per mille level. The res...

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Detalles Bibliográficos
Autores principales: Nardulli, Alessandro, Blaha, J, Cartiglia, N, Combaret, C, Djambazov, L, Dröge, M, Economou, A, Fay, J, Lustermann, W, Obertino, M
Lenguaje:eng
Publicado: CERN 2007
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2007-001.174
http://cds.cern.ch/record/1027433
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author Nardulli, Alessandro
Blaha, J
Cartiglia, N
Combaret, C
Djambazov, L
Dröge, M
Economou, A
Fay, J
Lustermann, W
Obertino, M
author_facet Nardulli, Alessandro
Blaha, J
Cartiglia, N
Combaret, C
Djambazov, L
Dröge, M
Economou, A
Fay, J
Lustermann, W
Obertino, M
author_sort Nardulli, Alessandro
collection CERN
description We report the results of tests of 12880 Very Front End (VFE) readout cards for the barrel of the CMS electromagnetic calorimeter. A thorough test sequence was applied to each card including power-on test, burn-in and final calibration. Cards failing the tests were at the few per mille level. The results prove the very high quality of the VFE cards.
id cern-1027433
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2007
publisher CERN
record_format invenio
spelling cern-10274332019-09-30T06:29:59Zdoi:10.5170/CERN-2007-001.174http://cds.cern.ch/record/1027433engNardulli, AlessandroBlaha, JCartiglia, NCombaret, CDjambazov, LDröge, MEconomou, AFay, JLustermann, WObertino, MPerformance of CMS ECAL Very Front End ElectronicsDetectors and Experimental TechniquesWe report the results of tests of 12880 Very Front End (VFE) readout cards for the barrel of the CMS electromagnetic calorimeter. A thorough test sequence was applied to each card including power-on test, burn-in and final calibration. Cards failing the tests were at the few per mille level. The results prove the very high quality of the VFE cards.CERNoai:cds.cern.ch:10274332007
spellingShingle Detectors and Experimental Techniques
Nardulli, Alessandro
Blaha, J
Cartiglia, N
Combaret, C
Djambazov, L
Dröge, M
Economou, A
Fay, J
Lustermann, W
Obertino, M
Performance of CMS ECAL Very Front End Electronics
title Performance of CMS ECAL Very Front End Electronics
title_full Performance of CMS ECAL Very Front End Electronics
title_fullStr Performance of CMS ECAL Very Front End Electronics
title_full_unstemmed Performance of CMS ECAL Very Front End Electronics
title_short Performance of CMS ECAL Very Front End Electronics
title_sort performance of cms ecal very front end electronics
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2007-001.174
http://cds.cern.ch/record/1027433
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