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Wafer test of the LHCb Outer Tracker TDC-Chip
The OTIS-TDC is the front end readout chip for the LHCb Outer Tracker. It is designed to measure drift times with a resolution better than 1 ns. As the chip will be directly mounted to its board, the test have to be performed on the wafer itself. As the testing period for 7 000 chips was only three...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
CERN
2007
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2007-001.475 http://cds.cern.ch/record/1034301 |