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VLSI Test Principles and Architectures: Design for Testability
| Autores principales: | , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Elsevier
2006
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/1034989 |
| _version_ | 1780912432403709952 |
|---|---|
| author | Wang, Laung-Terng Wen, Xiaoqing Wu, Cheng-Wen |
| author_facet | Wang, Laung-Terng Wen, Xiaoqing Wu, Cheng-Wen |
| author_sort | Wang, Laung-Terng |
| collection | CERN |
| id | cern-1034989 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2006 |
| publisher | Elsevier |
| record_format | invenio |
| spelling | cern-10349892021-04-22T02:00:38Zhttp://cds.cern.ch/record/1034989engWang, Laung-TerngWen, XiaoqingWu, Cheng-WenVLSI Test Principles and Architectures: Design for TestabilityEngineeringElsevieroai:cds.cern.ch:10349892006 |
| spellingShingle | Engineering Wang, Laung-Terng Wen, Xiaoqing Wu, Cheng-Wen VLSI Test Principles and Architectures: Design for Testability |
| title | VLSI Test Principles and Architectures: Design for Testability |
| title_full | VLSI Test Principles and Architectures: Design for Testability |
| title_fullStr | VLSI Test Principles and Architectures: Design for Testability |
| title_full_unstemmed | VLSI Test Principles and Architectures: Design for Testability |
| title_short | VLSI Test Principles and Architectures: Design for Testability |
| title_sort | vlsi test principles and architectures: design for testability |
| topic | Engineering |
| url | http://cds.cern.ch/record/1034989 |
| work_keys_str_mv | AT wanglaungterng vlsitestprinciplesandarchitecturesdesignfortestability AT wenxiaoqing vlsitestprinciplesandarchitecturesdesignfortestability AT wuchengwen vlsitestprinciplesandarchitecturesdesignfortestability |