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VLSI Test Principles and Architectures: Design for Testability

Detalles Bibliográficos
Autores principales:	Wang, Laung-Terng, Wen, Xiaoqing, Wu, Cheng-Wen
Lenguaje:	eng
Publicado:	Elsevier 2006
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/1034989

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