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Compatibility and testing of electronic components
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Butterworths
1972
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/103560 |
| _version_ | 1780876909777780736 |
|---|---|
| author | Jowett, Charles E |
| author_facet | Jowett, Charles E |
| author_sort | Jowett, Charles E |
| collection | CERN |
| id | cern-103560 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1972 |
| publisher | Butterworths |
| record_format | invenio |
| spelling | cern-1035602021-04-22T05:56:44Zhttp://cds.cern.ch/record/103560engJowett, Charles ECompatibility and testing of electronic componentsEngineeringButterworthsoai:cds.cern.ch:1035601972 |
| spellingShingle | Engineering Jowett, Charles E Compatibility and testing of electronic components |
| title | Compatibility and testing of electronic components |
| title_full | Compatibility and testing of electronic components |
| title_fullStr | Compatibility and testing of electronic components |
| title_full_unstemmed | Compatibility and testing of electronic components |
| title_short | Compatibility and testing of electronic components |
| title_sort | compatibility and testing of electronic components |
| topic | Engineering |
| url | http://cds.cern.ch/record/103560 |
| work_keys_str_mv | AT jowettcharlese compatibilityandtestingofelectroniccomponents |