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TCT characterization of different semiconductor materials for particle detection
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
2006
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2006.05.003 http://cds.cern.ch/record/1035628 |
| _version_ | 1780912506865188864 |
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| author | Fink, J |
| author_facet | Fink, J |
| author_sort | Fink, J |
| collection | CERN |
| id | cern-1035628 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2006 |
| record_format | invenio |
| spelling | cern-10356282019-09-30T06:29:59Zdoi:10.1016/j.nima.2006.05.003http://cds.cern.ch/record/1035628engFink, JTCT characterization of different semiconductor materials for particle detectionDetectors and Experimental Techniquesoai:cds.cern.ch:10356282006 |
| spellingShingle | Detectors and Experimental Techniques Fink, J TCT characterization of different semiconductor materials for particle detection |
| title | TCT characterization of different semiconductor materials for particle detection |
| title_full | TCT characterization of different semiconductor materials for particle detection |
| title_fullStr | TCT characterization of different semiconductor materials for particle detection |
| title_full_unstemmed | TCT characterization of different semiconductor materials for particle detection |
| title_short | TCT characterization of different semiconductor materials for particle detection |
| title_sort | tct characterization of different semiconductor materials for particle detection |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/j.nima.2006.05.003 http://cds.cern.ch/record/1035628 |
| work_keys_str_mv | AT finkj tctcharacterizationofdifferentsemiconductormaterialsforparticledetection |