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TCT characterization of different semiconductor materials for particle detection

Detalles Bibliográficos
Autor principal:	Fink, J
Lenguaje:	eng
Publicado:	2006
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/j.nima.2006.05.003 http://cds.cern.ch/record/1035628

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