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Development of SEU-robust, radiation-tolerant and industry-compatible programmable logic components

Most of the microelectronics components developed for the first generation of LHC experiments have been defined and designed with very precise experiment-specific goals and are fully optimized for these applications. In an effort to cover the needs for generic programmable components, often needed i...

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Detalles Bibliográficos
Autores principales: Bonacini, S, Kloukinas, K, Marchioro, A
Lenguaje:eng
Publicado: CERN 2007
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/2/09/P09009
https://dx.doi.org/10.5170/CERN-2007-007.321
http://cds.cern.ch/record/1061594
Descripción
Sumario:Most of the microelectronics components developed for the first generation of LHC experiments have been defined and designed with very precise experiment-specific goals and are fully optimized for these applications. In an effort to cover the needs for generic programmable components, often needed in the real world, an industry-compatible Programmable Logic Device (PLD) and an industry-compatible Field-Programmable Gate Array (FPGA) are now under development. This effort is targeted to small volume applications or to the cases where small programmable functions are required to fix a system application. The PLD is a fuse-based, 10-input, 8-I/O general architecture device compatible with a popular commercial part, and is fabricated in 0.25 μm CMOS. The FPGA under development is instead a 32 × 32 logic block array, equivalent to 25k gates, to be fabricated in 0.13 μm CMOS. The work focusses on the design of SEU-robust registers which can be employed for configuration storage as well as for user data flip-flops. The SEU-robust registers were tested in a heavy-ion beam facility; test results are presented.