Planar edgeless silicon detectors for the TOTEM experiment

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Recently the first prototype of microstrip edgeless silicon detector for the TOTEM experiment has been successfully produced and tested. This detector is fabricated with standard planar technology, reach sensitivity 50 μm from the cut edge and can operate with high bias at room temperature. These al...

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Detalles Bibliográficos
Autores principales: Ruggiero, G, Eremin, V, Noschis, E
Lenguaje:eng
Publicado: 2007
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2007.07.110
http://cds.cern.ch/record/1064029

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