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Planar edgeless silicon detectors for the TOTEM experiment
Recently the first prototype of microstrip edgeless silicon detector for the TOTEM experiment has been successfully produced and tested. This detector is fabricated with standard planar technology, reach sensitivity 50 μm from the cut edge and can operate with high bias at room temperature. These al...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2007
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2007.07.110 http://cds.cern.ch/record/1064029 |
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por Ruggiero, G., Alagoz, E., Avati, V., Bassetti, V., Berardi, V., Bergholm, V., Boccone, V., Bozzo, M., Buzzo, A., Catanesi, M.G., Cereseto, R., Cuneo, S., Deile, M., De Oliveira, R., Eggert, K., Egorov, N., Eremin, I., Ferro, F., Hasi, J., Lokajiccek, M., Haug, F., Herzog, R., Jarron, P., Kalliopuska, J., Kiiskinen, A., Kurvinen, K., Kok, A., Kundrat, W., Lauhakangas, R., Lokajicek, M., Macina, D., Macri, M., Maki, T., Minutoli, S., Mirabito, L., Morelli, A., Musico, P., Negri, M., Niewiadomski, H., Noschis, E., Oljemark, F., Orava, R., Oriunno, M., Osterberg, K., Palmieri, V.G., Puppo, R., Radicioni, E., Rudischer, R., Saarikko, H., Sanguinetti, G., Santroni, A., Siegrist, P., Sidorov, A., Sette, G., Smotlacha, J., Snoeys, W., Tapprogge, S., Toppinen, A., Verdier, A., Watts, S., Wobst, E., Lyon, IPN
Publicado 2006
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Publicado 2006
Enlace del recurso