Cargando…
VLSI testing
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
North-Holland
1986
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/107700 |
| _version_ | 1780877667540664320 |
|---|---|
| author | Williams, T W |
| author_facet | Williams, T W |
| author_sort | Williams, T W |
| collection | CERN |
| id | cern-107700 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1986 |
| publisher | North-Holland |
| record_format | invenio |
| spelling | cern-1077002021-04-22T05:25:15Zhttp://cds.cern.ch/record/107700engWilliams, T WVLSI testingEngineeringNorth-Hollandoai:cds.cern.ch:1077001986 |
| spellingShingle | Engineering Williams, T W VLSI testing |
| title | VLSI testing |
| title_full | VLSI testing |
| title_fullStr | VLSI testing |
| title_full_unstemmed | VLSI testing |
| title_short | VLSI testing |
| title_sort | vlsi testing |
| topic | Engineering |
| url | http://cds.cern.ch/record/107700 |
| work_keys_str_mv | AT williamstw vlsitesting |