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Reliability engineering for electronic systems
| Autores principales: | , , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Wiley
1964
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/108252 |
| _version_ | 1780877769503145984 |
|---|---|
| author | Gordy, Harold M Wong, Kam L Myers, Richard H |
| author_facet | Gordy, Harold M Wong, Kam L Myers, Richard H |
| author_sort | Gordy, Harold M |
| collection | CERN |
| id | cern-108252 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1964 |
| publisher | Wiley |
| record_format | invenio |
| spelling | cern-1082522021-04-22T05:21:15Zhttp://cds.cern.ch/record/108252engGordy, Harold MWong, Kam LMyers, Richard HReliability engineering for electronic systemsEngineeringWileyoai:cds.cern.ch:1082521964 |
| spellingShingle | Engineering Gordy, Harold M Wong, Kam L Myers, Richard H Reliability engineering for electronic systems |
| title | Reliability engineering for electronic systems |
| title_full | Reliability engineering for electronic systems |
| title_fullStr | Reliability engineering for electronic systems |
| title_full_unstemmed | Reliability engineering for electronic systems |
| title_short | Reliability engineering for electronic systems |
| title_sort | reliability engineering for electronic systems |
| topic | Engineering |
| url | http://cds.cern.ch/record/108252 |
| work_keys_str_mv | AT gordyharoldm reliabilityengineeringforelectronicsystems AT wongkaml reliabilityengineeringforelectronicsystems AT myersrichardh reliabilityengineeringforelectronicsystems |