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7th International Conference on Radiation Damage and Defects in Semiconductors

Detalles Bibliográficos
Autor principal: Whitehouse, John E
Lenguaje:eng
Publicado: IOP 1973
Materias:
Acceso en línea:http://cds.cern.ch/record/108802
_version_ 1780877873793466368
author Whitehouse, John E
author_facet Whitehouse, John E
author_sort Whitehouse, John E
collection CERN
id cern-108802
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1973
publisher IOP
record_format invenio
spelling cern-1088022021-04-22T21:59:32Zhttp://cds.cern.ch/record/108802engWhitehouse, John E7th International Conference on Radiation Damage and Defects in SemiconductorsEngineeringIOPoai:cds.cern.ch:1088021973
spellingShingle Engineering
Whitehouse, John E
7th International Conference on Radiation Damage and Defects in Semiconductors
title 7th International Conference on Radiation Damage and Defects in Semiconductors
title_full 7th International Conference on Radiation Damage and Defects in Semiconductors
title_fullStr 7th International Conference on Radiation Damage and Defects in Semiconductors
title_full_unstemmed 7th International Conference on Radiation Damage and Defects in Semiconductors
title_short 7th International Conference on Radiation Damage and Defects in Semiconductors
title_sort 7th international conference on radiation damage and defects in semiconductors
topic Engineering
url http://cds.cern.ch/record/108802
work_keys_str_mv AT whitehousejohne 7thinternationalconferenceonradiationdamageanddefectsinsemiconductors