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Thin film and depth profile analysis
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
1984
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-642-46499-7 http://cds.cern.ch/record/109128 |
| _version_ | 1780877931249139712 |
|---|---|
| author | Etzkorn, H W Hofer, W O Hofmann, S Öchsner, Hans |
| author_facet | Etzkorn, H W Hofer, W O Hofmann, S Öchsner, Hans |
| author_sort | Etzkorn, H W |
| collection | CERN |
| id | cern-109128 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1984 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-1091282021-04-22T05:14:40Zdoi:10.1007/978-3-642-46499-7http://cds.cern.ch/record/109128engEtzkorn, H WHofer, W OHofmann, SÖchsner, HansThin film and depth profile analysisOther Fields of PhysicsSpringeroai:cds.cern.ch:1091281984 |
| spellingShingle | Other Fields of Physics Etzkorn, H W Hofer, W O Hofmann, S Öchsner, Hans Thin film and depth profile analysis |
| title | Thin film and depth profile analysis |
| title_full | Thin film and depth profile analysis |
| title_fullStr | Thin film and depth profile analysis |
| title_full_unstemmed | Thin film and depth profile analysis |
| title_short | Thin film and depth profile analysis |
| title_sort | thin film and depth profile analysis |
| topic | Other Fields of Physics |
| url | https://dx.doi.org/10.1007/978-3-642-46499-7 http://cds.cern.ch/record/109128 |
| work_keys_str_mv | AT etzkornhw thinfilmanddepthprofileanalysis AT hoferwo thinfilmanddepthprofileanalysis AT hofmanns thinfilmanddepthprofileanalysis AT ochsnerhans thinfilmanddepthprofileanalysis |