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Thin film and depth profile analysis

Detalles Bibliográficos
Autores principales:	Etzkorn, H W, Hofer, W O, Hofmann, S, Öchsner, Hans
Lenguaje:	eng
Publicado:	Springer 1984
Materias:	Other Fields of Physics
Acceso en línea:	https://dx.doi.org/10.1007/978-3-642-46499-7 http://cds.cern.ch/record/109128

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