Final Test at the Surface of the ATLAS Endcap Muon Trigger Chamber Electronics

For the detector commissioning planned in 2007, sector assembly of the ATLAS muon-endcap trigger chambers and final test at the surface for the assembled electronics are being done in CERN and almost completed. For the test, we built up the Data Acquisition (DAQ) system using test pulse of two types...

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Detalles Bibliográficos
Autores principales: Kubota, T, Ishino, M, Kanaya, N, Kawamoto, T, Kobayashi, T, Kuwabara, T, Nomoto, H, Sakamoto, H, Yamaguchi, T, Fukunaga, C, Ikeno, M, Iwasaki, H, Nagano, K, Nozaki, M, Sasaki, O, Tanaka, S, Yasu, Y, Hasegawa, Y, Oshita, H, Takeshita, T, Nomachi, M, Sugaya, Y, Sugimoto, T, Okumura, Y, Takahashi, Y, Tomoto, M, Kadosaka, T, Kawagoe, K, Kiyamura, H, Kurashige, H, Niwa, T, Ochi, A, Omachi, C, Takeda, H, Lifshitz, R, Lupu, N, Bressler, S, Tarem, S, Kajomovitz, E, Ben Ami, S, Bahat Treidel, O, Benhammou, Ya, Etzion, E, Lellouch, D, Levinson, L, Mikenberg, G, Roich, A
Lenguaje:eng
Publicado: CERN 2007
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.5170/CERN-2007-007.463
http://cds.cern.ch/record/1091528
Descripción
Sumario:For the detector commissioning planned in 2007, sector assembly of the ATLAS muon-endcap trigger chambers and final test at the surface for the assembled electronics are being done in CERN and almost completed. For the test, we built up the Data Acquisition (DAQ) system using test pulse of two types and cosmic rays in order to check functionality of the various aspects of the electronics mounted on a sector. So far, 99% of all 320,000 channels have been tested and most of them were installed into the ATLAS cavern. In this presentation, we will describe the DAQ systems and mass-test procedure in detail, and report the result of electronics test with some actual experiences

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