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Conference on Tests Based on the Sample Distribution Function
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Lenguaje: | eng |
Publicado: |
Soc. for Industrial and Applied Mathematics
1973
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Acceso en línea: | http://cds.cern.ch/record/110216 |
_version_ | 1780878125058490368 |
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author | Durbin, John R |
author_facet | Durbin, John R |
author_sort | Durbin, John R |
collection | CERN |
id | cern-110216 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1973 |
publisher | Soc. for Industrial and Applied Mathematics |
record_format | invenio |
spelling | cern-1102162021-04-22T21:57:28Zhttp://cds.cern.ch/record/110216engDurbin, John RConference on Tests Based on the Sample Distribution FunctionMathematical Physics and MathematicsSoc. for Industrial and Applied Mathematicsoai:cds.cern.ch:1102161973 |
spellingShingle | Mathematical Physics and Mathematics Durbin, John R Conference on Tests Based on the Sample Distribution Function |
title | Conference on Tests Based on the Sample Distribution Function |
title_full | Conference on Tests Based on the Sample Distribution Function |
title_fullStr | Conference on Tests Based on the Sample Distribution Function |
title_full_unstemmed | Conference on Tests Based on the Sample Distribution Function |
title_short | Conference on Tests Based on the Sample Distribution Function |
title_sort | conference on tests based on the sample distribution function |
topic | Mathematical Physics and Mathematics |
url | http://cds.cern.ch/record/110216 |
work_keys_str_mv | AT durbinjohnr conferenceontestsbasedonthesampledistributionfunction |