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Conference on Tests Based on the Sample Distribution Function

Detalles Bibliográficos
Autor principal: Durbin, John R
Lenguaje:eng
Publicado: Soc. for Industrial and Applied Mathematics 1973
Materias:
Acceso en línea:http://cds.cern.ch/record/110216
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author Durbin, John R
author_facet Durbin, John R
author_sort Durbin, John R
collection CERN
id cern-110216
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1973
publisher Soc. for Industrial and Applied Mathematics
record_format invenio
spelling cern-1102162021-04-22T21:57:28Zhttp://cds.cern.ch/record/110216engDurbin, John RConference on Tests Based on the Sample Distribution FunctionMathematical Physics and MathematicsSoc. for Industrial and Applied Mathematicsoai:cds.cern.ch:1102161973
spellingShingle Mathematical Physics and Mathematics
Durbin, John R
Conference on Tests Based on the Sample Distribution Function
title Conference on Tests Based on the Sample Distribution Function
title_full Conference on Tests Based on the Sample Distribution Function
title_fullStr Conference on Tests Based on the Sample Distribution Function
title_full_unstemmed Conference on Tests Based on the Sample Distribution Function
title_short Conference on Tests Based on the Sample Distribution Function
title_sort conference on tests based on the sample distribution function
topic Mathematical Physics and Mathematics
url http://cds.cern.ch/record/110216
work_keys_str_mv AT durbinjohnr conferenceontestsbasedonthesampledistributionfunction