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Dynamic imperfections and optimized feedback design in the Compact Linear Collider main linac

The Compact Linear Collider (CLIC) main linac is sensitive to dynamic imperfections such as element jitter, injected beam jitter, and ground motion. These effects cause emittance growth that, in case of ground motion, has to be counteracted by a trajectory feedback system. The feedback system itself...

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Detalles Bibliográficos
Autor principal: Eliasson, Peder
Lenguaje:eng
Publicado: 2008
Materias:
Acceso en línea:https://dx.doi.org/10.1103/PhysRevSTAB.11.051003
http://cds.cern.ch/record/1110723
Descripción
Sumario:The Compact Linear Collider (CLIC) main linac is sensitive to dynamic imperfections such as element jitter, injected beam jitter, and ground motion. These effects cause emittance growth that, in case of ground motion, has to be counteracted by a trajectory feedback system. The feedback system itself will, due to jitter effects and imperfect beam position monitors (BPMs), indirectly cause emittance growth. Fast and accurate simulations of both the direct and indirect effects are desirable, but due to the many elements of the CLIC main linac, simulations may become very time consuming. In this paper, an efficient way of simulating linear (or nearly linear) dynamic effects is described. The method is also shown to facilitate the analytic determination of emittance growth caused by the different dynamic imperfections while using a trajectory feedback system. Emittance growth expressions are derived for quadrupole, accelerating structure, and beam jitter, for ground motion, and for noise in the feedback BPMs. Finally, it is shown how the method can be used to design a feedback system that is optimized for the optics of the machine and the ground motion spectrum of the particular site. This feedback system gives an emittance growth rate that is approximately 10 times lower than that of traditional trajectory feedbacks. The robustness of the optimized feedback system is studied for a number of additional imperfections, e.g., dipole corrector imperfections and faulty knowledge about the machine optics, with promising results.