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Test beam Characterizations of 3D Silicon Pixel detectors
3D silicon detectors are characterized by cylindrical electrodes perpendicular to the surface and penetrating into the bulk material in contrast to standard Si detectors with planar electrodes on its top and bottom. This geometry renders them particularly interesting to be used in environments where...
Autores principales: | Mathes, M., Cristinziani, M., Da Via, C., Garcia-Sciveres, M., Einsweiler, K., Hasi, J., Kenney, C., Parker, Sherwood, Reuen, L., Ruspa, M., Velthuis, J., Watts, S., Wermes, N. |
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Lenguaje: | eng |
Publicado: |
2008
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/TNS.2008.2005630 http://cds.cern.ch/record/1111049 |
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